The paper explores error-related EEG patterns in tactile human-machine interaction, shedding light on how the brain responds to errors in this specific context.
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Lehne, M., Ihme, K., Brouwer, A.-M., van Erp, J. B. F., & Zander, T. O. (2009). Error-related EEG patterns during tactile human-machine interaction. In 2009 3rd international conference on affective computing and intelligent interaction and workshops (pp. 1–9). doi: 10.1109/ACII.2009.5349480